Bruker S1 Turbo SD-LE Portable XRF Analyzer

Description

Bruker S1 Turbo SD-LE Portable XRF Analyzer

Bruker S1 Turbo SD-LE Portable XRF Analyzer based on Bruker’s proprietary X-Flas silicon drift detector (SDD) provides rapid alloy analysis and light element analysis. Provides analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only).

The improved resolution and count rate provides lower detection limits for all elements analyzed. Combine that with an extensive Alloy grade library and you have one of the most powerful handheld analyzers currently available on the market.

The benefits at a glance

Supports many calibrations and applications, including PMI, Scrap metal sorting and Mining & Exploration
The first ever SDD-based handheld analyzer
Superior count rates and resolution (compared to previous generation SiPin instruments)
Five times faster than previous generations
Lower detection limits
Grade library includes low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBO SD LE only)

Clarity and usability

We believe the best technology should be intuitive and instinctive to use. Every element of the S1 TURBOSD has been designed with this in mind. The bright display makes it easy to read in any lighting conditions. The touch screen means you can operate the whole machine with one finger, whether inputting a password or pulling the trigger. The operating system is Microsoft Windows – so well known that it’s almost universal. Data transfer options include Microsoft ActivSync via USB cable or wireless Bluetooth connection, as well as using an SD card. Built-in memory also makes it possible to store thousands of spectra and millions of results safely.