Oxford Maxxi 6 XRF Analyser

Description

Oxford Maxxi 6 XRF Analyser

Oxford Maxxi 6 XRF Analyser for coating thickness and materials analysis. The MAXXI 6 uses a high-resolution SDD detector capable of measuring coatings down to the nanoscale and element composition at trace level.

Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and
industry-proven analytical technique, offering easy to use, fast and non-destructive analysis,
requiring little to no sample preparation, capable of analysing solids or liquids over a wide
element range from 13Al to 92U on the periodic table.

With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for
measuring the thinnest coatings and element composition at trace level.

Key features

Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability, outstanding product life expectancy and low cost of ownership
Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
Multi collimator optimizes flux generation, enhancing measurement throughput
Giant slotted chamber design with generous interior
volume, ideal for a big variety of standard and oversized samples
The “USB easy choice” allows operation using a standard computer through USB connection with no additional hardware or firmware
Made in Germany to the highest engineering standards, robust design for long term reliability
Approved by PTB (Physikalisch Technische Bundesanstalt), ensures highest level of radiation safety

Software and calibration

Intuitive Windows 7 based MaxxControl software
Choice of empirical calibrations for highest accuracy or FP model for easy calibration
Free selection of elements for composition analysis and
free definable layer structure for thickness analysis
Factory preloaded calibration for RoHS and precious metals (optional)

Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and
industry-proven analytical technique, offering easy to use, fast and non-destructive analysis,
requiring little to no sample preparation, capable of analysing solids or liquids over a wide
element range from 13Al to 92U on the periodic table.
With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for
measuring the thinnest coatings and element composition at trace level.